Figure 6.
Figure 6 Reciprocal-space lattice in the presence of the
lattice-translocation defect of Fig. 3-with z
= 1/2. When the defect occurs with low frequency ( <
5%), the streaky features are limited to slightly elliptically
shaped lattice points. Such a limited defect can be partially
corrected during intensity integration using an elliptical
spot-shape option when the crystal is rotated along the a* axis
during data collection, but it cannot when the axis of the
crystal rotation is perpendicular to a*. In the latter case,
streaky features would appear only in one orientation and many
extra Bragg reflections would not be predictable with a standard
definition of the mosaicity in a second orientation that is
90° away from the first orientation.
z
= 1/2. When the defect occurs with low frequency ( 
<
5%), the streaky features are limited to slightly elliptically
shaped lattice points. Such a limited defect can be partially
corrected during intensity integration using an elliptical
spot-shape option when the crystal is rotated along the a* axis
during data collection, but it cannot when the axis of the
crystal rotation is perpendicular to a*. In the latter case,
streaky features would appear only in one orientation and many
extra Bragg reflections would not be predictable with a standard
definition of the mosaicity in a second orientation that is
90° away from the first orientation.