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Date (dd-MMM-yyyy) of imaging experiment. If the imaging session time period was longer than one day, please provide the imaging session starting date. If images from multiple imaging sessions were used in the reconstruction, please indicate by duplicating this section.Example: 19-OCT-1995
The make and model of electron microscope.Example: HITACHI HF2000
If the microscope used is not found in the drop-down list, report it in this text area.
Example: JEOL 5000EX
The accelerating voltage (in kV) used for imaging.Range: 0.5 to 5000.0
The mode of illumination.Example: FLOOD BEAM
If the illumination mode used is not found in the drop-down list, report it in this text area.
Imaging mode.Example: DARK FIELD
If the imaging mode used is not found in the drop-down list, report it in this text area.
Electron beam double-deflection coils may be used to shift
and tilt the beam and are used for aligning the objective lens
and correct beam movement caused by the condenser
Beam tilt is visible in difraction as a diffraction shift so beam shift are set in diffraction mode whilst beam tilt pivot points are set in image mode where a beam shift will be visible.
The Coma Free centre is the most accurate positioning of the beam tilt for optimum HRTEM imaging. If it is not corrected, the phase shift induced by the objective lens for diffracted beams at h and at -h will not be the same, which significantly effects high-resolution images.
The spherical aberration coefficient (Cs) in millimetres,of the objective lens.Range: 0.0 to 10.0 (in millimetres)
Astigmatism in the electron microscope is caused by small
imperfections in the rotational symmetry of the electron lens.
This causes the lens to focus more strongly than in the
perpendicular direction, causing an asymmetry callled
astigmatism. Thsi image defect is corrected by the
Electron microscopes have three sets of stigmators: the condenser stigmator to make the focussed beam circular, the objective stigmator to correct astigmatism in the high-magnification image and for low angle diffractio patterns, and the diffraction stigmator to correct astigmatism in the diffraction pattern. The stigmator consists of a quadrupole whose four elements are arranged at 90 degrees around the beam. Each stigmator consists of 2 elements, one mounted above the other and rotateable by 45 degrees with respect to each other. This combination of 2 elements allows correction of the astigmatism in any direction.
The minimum defocus value of the objective lens (in nanometres) used to record images. Negative values represent overfocus.Range: -10000.0 to 10000.0 (in nanometres)
The maximum defocus value of the objective lens (in nanometres) used to record images. Negative values represent overfocus.Range: -20000.0 to 20000.0 (in nanometres)
The minimum angle (in degrees) to which the specimen was tilted to obtain recorded images.Range: -90.0 to 90.0 (in degrees)
The maximum angle (in degrees) to which the specimen was tilted to obtain recorded images.Range: -90.0 to 90.0 (in degrees)
The magnification indicated by the microscope readout.Range: 100 to 1000000
The magnification value obtained for a known standard just prior to, during or just after the imaging experiment.Range: 100.0 to 1000000.0
The source of electrons is the electron 'gun'. The electron emitter material is usually a lanthanide (lanthanum hexaboride, LaB6) or tungsten. The most common thermionic emitter is a tungsten 'hairpin' filament. Tungsten, drawn to a fine point, is also used in Field Emission electron guns (FEGs).Example: TUNGSTEN HAIRPIN
If the electron source used is not found in the drop-down list, report it in this text area.
An estimate of the total electron dose received by the sample (electrons per square angstrom).Range: 0 to 1000 (electrons per square angstrom)
The make and model of the electron energy filter and/or spectrometer.The microscope manufacturers can incorporate electron energy filter spectrometers into specific microscope models. Examples: The LEO 912AB is configured for the demands of advanced bio-med applications. It delivers ultimate image quality for all specimen preparations and offers unlimited flexibility for consistent and new imaging and analysis methods as electron spectroscopic imaging (ESI) and electron energy loss spectroscopy (EELS). The JEM-3100FEF features a new filter system (Omega filter) for electron energy loss spectrometry, achieving high contrast atomic imaging and facilitating elemental analysis.Example: LEO 912AB
The energy filter range in electron volts (eV). Inelastically scattered electrons result from interactions of the beam with specimen electrons within the atomic shell. Energy is transferred to the shell electron and then released. This energy loss is specific for the target electron within each electron shell (K,L,M,N,O), and is also characteristic for each element. It ranges from 10-100 electron volts (eV). An atlas is available to match the element detected with the characteristic spectrum of the distribution of inelastically scattered electrons. The atlas also permits one to set the correct filter position to capture the ineleastically scattered electrons of choice. A small change in direction also occurs, typically from 0-1 mradians, and the population of inelastically scattered electrons are 'polychromatic'. The small change in direction means that the majority of inelastically-scattered electrons are allowed through the objective aperture, and so contribute to the image.Range: 0-1000 (eV)
The make and model of specimen holder used during imaging.Example: GATAN HELIUM
If the specimen holder model used is not found in the drop-down list, report it in this text area.
Additional details about the specimen holder used during imaging.Example: This holder operates in the temperature range from -175 C to ambient, and gives a resolution of at least 0.34 nanometres.
The specimen temperature minimum (kelvin scale) for the duration of imaging.Range: 2.0 to 310.0 (in kelvin)
The specimen temperature maximum (kelvin scale) for the duration of imaging.Range: 2.0 to 310.0 (in kelvin)
The mean specimen stage temperature (kelvin scale) during imaging in the microscope.Range: 2.0 to 310.0 (in kelvin)
The camera length (in millimetres). The camera length is the product of the objective focal length and the combined magnification of the intermediate and projector lenses when the microscope is operated in the diffraction mode.Range: 0.0 to 30000.0 (in millimetres)
The electron detector used for recording images directly from the electron microscope.Usually film or CCD camera.Example: GATAN 673 (CCD camera)
If the image detector used is not found in the drop-down list, report it in this text area.
Example: TVIPS TemCam-Futura
Any additional imaging details.Example: A Gatan 651 blade-type anticontaminator was fitted, with a minimum achievable temperature of -185 C.