Dbfetch
ID GZ298427; SV 1; linear; genomic DNA; PAT; UNC; 121 BP. XX AC GZ298427; XX DT 06-JUN-2012 (Rel. 113, Created) DT 06-JUN-2012 (Rel. 113, Last updated, Version 1) XX DE Sequence 32 from patent US 8173400. XX KW . XX OS unidentified OC unclassified sequences. XX RN [1] RP 1-121 RA Imai S., Tanaka K.; RT "Method of detecting or quantitating endogenous wheat DNA and method of RT determining contamination rate of genetically modified wheat in test RT sample"; RL Patent number US8173400-B2/32, 08-MAY-2012. RL Nisshin Seifun Group Inc.; RL Tokyo. XX DR MD5; 23be38d24a80082e947696b361f7f56b. XX FH Key Location/Qualifiers FH FT source 1..121 FT /organism="unidentified" FT /mol_type="genomic DNA" FT /db_xref="taxon:32644" XX SQ Sequence 121 BP; 23 A; 45 C; 29 G; 24 T; 0 other; cctttaggat ttcagcatca gtggctacag cctgcatgct tcacggtgca agcagccggc 60 ccgcaaccgc ccgcaaatcc tctggccttt ccggaaccgt ccgcattccc ggcgacaagt 120 c 121 //